1 | info | Degradation evaluation of titanium dioxide under stress factors | TAŞÇIOĞLU AYŞEGÜL, YILMAZ GÖKHAN | Gumushane University Journal of Science and Technology Institute | 2023 | Uluslararası, Hakemli, Basılı+Elektronik, TR DİZİN |
2 | info | Aging evaluation of PEDOT:PSS films for high-efficient perovskite solar cells | YILMAZ GÖKHAN, ÇOĞAL SADIK | Springer Science and Business Media LLC / The Journal of Materials Science: Materials in Electronics | 2023 | Uluslararası, Hakemli, Basılı+Elektronik, SCI-Expanded |
3 | info | Dark And Photoconductivity Behavior of CH3NH3PbI3 Thin Films Depending On Atmospheric Conditions | TAŞÇIOĞLU AYŞEGÜL, YILMAZ GÖKHAN | Igdir University | 2022 | Uluslararası, Hakemli, Basılı+Elektronik, TR DİZİN |
4 | info | Silisyum İnce Filmlerde Taban Malzemelerin Elektronik Kusurlar Üzerine Etkisinin Belirlenmesi | YILMAZ GÖKHAN | Süleyman Demirel Üniversitesi Fen Bilimleri Enstitüsü Dergisi | 2022 | Uluslararası, Hakemli, Elektronik, TR DİZİN |
5 | info | Lead iodide thin-film morphological-dependent metastability investigation by electrical conductivity | YILMAZ GÖKHAN, Coşğun Ayşegül, TAŞÇIOĞLU AYŞEGÜL | Journal of Materials Science: Materials in Electronics | 2021 | Uluslararası, Hakemli, Elektronik, SCI-Expanded |
6 | info | Creation and investigation of electronic defects on methylammonium lead iodide (CH3NH3PbI3) films depending on atmospheric conditions | YILMAZ GÖKHAN | EUROPEAN PHYSICAL JOURNAL D | 2021 | Uluslararası, Hakemli, Elektronik, SCI |
7 | info | İnce Film Üretiminde Kimyasal Buhar Biriktirme Yöntemi ve Çeşitleri | Coşğun Ayşegül, TAŞÇIOĞLU AYŞEGÜL, YILMAZ GÖKHAN | Mehmet Akif Ersoy Üniversitesi Fen Bilimleri Enstitüsü Dergisi | 2021 | Uluslararası, Hakemli, Elektronik, Directory of Open Access Journals, Crossref, WorldCat, RootIndexing, Google Scholar, Directory of Research Journals Indexing |
8 | info | Perovskit Güneş Hücreleri ve Kararsızlık Problemleri | ÖZKÖK ÇAĞLAR, YILMAZ GÖKHAN | Mehmet Akif Ersoy Üniversitesi Fen Bilimleri Enstitüsü Dergisi | 2018 | Uluslararası, Hakemli, Elektronik, CAB Abstracts |
9 | info | μc-Si: H İnce Film Malzemeler ve Metastabilite Etkileri | YILMAZ GÖKHAN | Mehmet Akif Ersoy Üniversitesi Fen Bilimleri Enstitüsü Dergisi | 2017 | Uluslararası, Hakemli, Elektronik, CAB Abstracts |
10 | info | Investigation of Metastability and In stability Effects on the Minority Carrier Transport Properties of Microcrystalline Silicon Thin Films by Using the Steady State Photocarrier Grating SSPG Technique | CANSEVER HAMZA, GÜNEŞ MEHMET, YILMAZ GÖKHAN, ŞAĞBAN HÜSEYİN MUZAFFER, Smirnov Vladimir, Finger Friedhelm, Brüggemann Rudolf | Canadian Journal of Physics | 2014 | Uluslararası, Hakemli, Elektronik, SCI |
11 | info | Atmospheric Aging and Light induced Degradation of Amorphous and Nanostructured Silicon Using Photoconductivity and Electron Spin Resonance | Zaki Saleh Zaki, NOGAY GİZEM, ÖZKOL Engin, YILMAZ GÖKHAN, ŞAĞBAN HÜSEYİN MUZAFFER, GÜNEŞ MEHMET, TURAN RAŞİT | Canadian Journal of Physics | 2014 | Uluslararası, Hakemli, Elektronik, SCI |
12 | info | Investigation of meta and in stability effects in hydrogenated microcrystalline silicon thin films by the steady state measurement methods | GÜNEŞ MEHMET, CANSEVER HAMZA, YILMAZ GÖKHAN, ŞAĞBAN HÜSEYİN MUZAFFER, Smirnov Vladimir, Finger Friedhelm, Brüggemann Rudolf | Canadian Journal of Physics | 2014 | Uluslararası, Hakemli, Elektronik, SCI |
13 | info | Reversible and irreversible effects after oxygen exposure in thick gt 1 m silicon films deposited by VHF PECVD on glass substrates investigated by dual beam photoconductivity | YILMAZ GÖKHAN, CANSEVER HAMZA, ŞAĞBAN HÜSEYİN MUZAFFER, GÜNEŞ MEHMET, Smirnov Vladimir, Finger Friedhelm, Brüggemann Rudolf | Canadian Journal of Physics | 2013 | Uluslararası, Hakemli, Elektronik, SCI |
14 | info | Metastability effects in hydrogenated microcrystalline silicon thin films investigated by the dual beam photoconductivity method | GÜNEŞ MEHMET, CANSEVER HAMZA, YILMAZ GÖKHAN, Smirnov Vladimir, Finger Friedhelm, Brüggemann Rudolf | Journal of Non-Crystalline Solids | 2012 | Uluslararası, Hakemli, Elektronik, SCI |
15 | info | Rapid Reversible Degradation of Silicon Thin Films by a Treatment in Water | TURAN ELİF, YILMAZ GÖKHAN, Smirnov Vladimir, Finger Friedhelm, GÜNEŞ MEHMET | JAPANESE JOURNAL OF APPLIED PHYSICS | 2012 | Uluslararası, Hakemli, Basılı+Elektronik, SCI |
16 | info | Investigation of light induced degradation in hydrogenated amorphous silicon‐germanium alloy thin films using temperature dependent photoconductivity | GÜNEŞ MEHMET, TURAN ELİF, YILMAZ GÖKHAN | Wiley | 2010 | Uluslararası, Hakemli, Basılı+Elektronik, Scopus |
17 | info | Instability effects in hydrogenated microcrystalline silicon thin films | YILMAZ GÖKHAN,GÜNEŞ MEHMET,TURAN ELİF,Smirnov Vladimir,Finger Friedhelm,Brüggemann Rudolf | Wiley | 2010 | Uluslararası, Hakemli, Basılı+Elektronik, Scopus |
18 | | Investigation of meta and in stability effect in thin film silicon materials using intensity and temperature dependence of photoconductivity | GÜNEŞ MEHMET, TURAN ELİF, YILMAZ GÖKHAN | JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS | 2009 | Uluslararası, Hakemli, Basılı, Endekste taranmıyor |